Based on some a little bit
irrelevant comments on "hum" 50Hz components, which in fact almost does not affect the noise integrated flat over 22Hz - 22kHz range, I have improved screening of my test setup (mumetal above pre input, cartridge placed into shielded little box) and eliminated the hum components. The resulting noise with Shure M35X is almost unchanged
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The difference between the bipolar ADA4898 and JFET OPA627 noise and SINAD remains unchanged and everything written in post #1 remains valid.
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For those who wish to argue with SINAD results please study first the definitions that have also been provided in post #1. The conclusions are unchanged, measuring noise and SINAD from 20 ohm generator or with shorted preamp input gives valid results for such setup, however invalid results under real world conditions with MM cartridge regarding the noise.
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Note: it is almost unimportant which MM cartridge is used for testing. The only important point is that it has inductance of several hundreds mH and this inductance is a key point in revealing contribution of amplifier current noise (and cartridge impedance // 47k thermal noise) to resulting noise and SINAD. Contribution that is hidden with usual 20 ohm AP generator testing. This has been known as long as I am involved in audio, and this is since late seventies of the previous century.