This would mean 2 sliding notch filters that match fairly well (phase is my concern in case the notch is deep).
With software and thorough individual calibration this should be feasible.
"WRONG PROPOSITION"
It is possible to make
the measurement of the 2 channels in delayed time.
It can be done with an E1DA adc, it is necessary
to record on the same channel 2 *wav at
different times (in mono)
The ADC noise will be decorrelated in time therefore on the FFT.
Well, it is necessary to double the measurement time, OK
But if you use the E1DA ADC measurement in "mono"
we gain in addition "3db" it will be a plus the day
when the DACs will go below the 135dBFS of THD + N
In addition it will be necessary to adjust only one ADC and only one
notch filter.
We can take by software take alternately on a mono signal
a block of sample and the next one and correlate them, the noise will be
different in time from one sample to another. It will certainly be necessary
to look closely at the possibility of overlap.
Well, I think there are still some ideas that will emerge.